Ultimate Angle-resolved Photoemission Microscopy System
Electrons in materials govern electric and magnetic properties. Angle-resolved photoemission spectroscopy (ARPES) is a powerful probe to directly characterize electronic structures in energy and momentum spaces. Traditional ARPES system has been developed to improve their energy and momentum resolutions, often called “high-resolution ARPES system”. However, there has been little attention towards a spatial resolution, making it difficult to measure tiny samples or samples having spatial inhomogeneity. The research group led by Specially-appointed Associate Professor Hideaki Iwasawa, Hiroshima University, developed a new ARPES system at Hiroshima Synchrotron Radiation Center (HiSOR), in collaboration with National Institute of Advanced Industrial Science and Technology. They developed the state-of-the-art ARPES system having not only ultimate energy and angular resolutions (<260 μeV and <0.05 deg) but also micro-scale spatial resolution (<5 μm). New system enabled us to map out a spatial distribution of ARPES signals on a sample surface, and to perform a point-probe ARPES measurement, providing excellent quality ARPES spectra. They have also developed new software and acquisition methods for increasing accuracy and speeding up high-resolution ARPES microscopy experiments in automated manner. The system is now ready for international collaborative projects, and have been applied to advanced materials science research.
Ultimate Angle-resolved Photoemission Microscopy System developed at HiSOR
- Title: Development of laser-based scanning μ-ARPES system with ultimate energy and momentum resolutions
- Journal: Ultramicroscopy
- Authors: Hideaki Iwasawa, Eike F. Schwier, Masashi Arita, Akihiro Ino, Hirofumi Namatame, Masaki Taniguchi, Yoshihiro Aiura, Kenya Shimada
- DOI: 10.1016/j.ultramic.2017.06.016
- Title: Accurate and efficient data acquisition methods for high-resolution angle-resolved photoemission microscopy
- Journal: Scientific Reports
- Authors: Hideaki Iwasawa, Hitoshi Takita, Kazuki Goto, Wumiti Mansuer, Takeo Miyashita, Eike F. Schwier, Akihiro Ino, Kenya Shimada, and Yoshihiro Aiura
- DOI: 10.1038/s41598-018-34894-7