HiSORセミナー
Developments in sample environment for a scanning transmission X-ray microscope at UVSOR-III Synchrotron
日時 2023年4月12日 （水） 13：30～14：30
場所 広島大学放射光科学研究センター 2階 セミナー室
講師 Takuji Ohigashi
(Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK))
Scanning transmission X-ray microscopy (STXM) is based on 2-dimentional X-ray absorption spectroscopy (XAS) and a powerful tool to analyze chemical states of heterogeneity samples with high spatial resolution around 30 nm. The STXM beamline, BL4U, in UVSOR-III Synchrotron equips an undulator as an insertion device and a variable-included-angle monochromator and the energy range from 55 to 770 eV is available [1,2]. BL4U has started operation for general users since 2013 and advanced chemical analysis for various sample environments has been developed under collaboration with academic and industrial users. In this talk, we have summarized our major developments for the last decade, such as cryo-cooling system, 3-dimensional computer tomography with spectroscopy, air-free sample transfer system and etc.
[1] T. Ohigashi, H. Arai, T. Araki, N. Kondo, E. Shigemasa, A. Ito, N. Kosugi, and M. Katoh, J. Phys.: Conf. Ser., 463, (2013), 012006.
[2] T. Ohigashi, H. Yuzawa and N. Kosugi, Rev. Sci. Instrum., 91, (2020), 103110.
問合せ先 出田真一郎（放射光科学研究センター）
